The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 1977
Filed:
Jan. 08, 1974
Tomio Yamamoto, Takamatsu, JA;
Koji Sakasegawa, Fukuyama, JA;
Atsushi Osumi, Fukuyama, JA;
Yukio Hosaka, Fukuyama, JA;
Takeo Yamada, Yokohama, JA;
Nippon Kokan Kabushiki Kaisha, Tokyo, JA;
Fuji Toyuki Kabushiki Kaisha, Takamatsu, JA;
Abstract
There are provided a method and apparatus for noncontact measurement of a gauge of a high temperature material such as a red-hot steel slab, wherein the entire optical system including a light source, a filter and a detector is employed at wavelengths in the near-ultraviolet zone, preferably in the range 4,300 - 4,400 A, and a sampling mark corresponding to a reference projection point for an optical mark of wavelengths in the near-ultraviolet zone is established on the screen of a television receiver on which the optical mark is displayed in accordance with the output of a camera tube which receives the optical mark through a band-pass filter which transmits the wavelengths in the near-ultraviolet zone, whereby the light source and the camera tube are translated from the reference positions until the optical mark formed on a high temperature material to be measured coincides with the sampling mark so that the gauge of the high temperature material is measured in accordance with the distance covered by the parallel motion of the light source and the camera tube.