The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 1977

Filed:

Feb. 27, 1976
Applicant:
Inventors:

James C Fletcher, , US;

Theodore R Creel, Jr, Yorktown, VA (US);

Robert A Jones, Newport News, VA (US);

Richard R Corwin, Xenia, OH (US);

Joseph S Kramer, Dayton, OH (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 1 / ;
Abstract

Apparatus for directly measuring the quantity .sqroot..rho.ck of a test specimen such as a wind tunnel model where .rho. is the density, c is the specific heat and k is the thermal conductivity of the specimen. The test specimen and a reference specimen are simultaneously subjected to the heat from a heat source. A thermocouple is attached to the reference specimen for producing a first electrical analog signal proportional to the heat rate Q that the test specimen is subjected to and an infrared radiometer that is aimed at the test specimen produces a second electrical analog signal proportional to the surface temperature T of the test specimen. An analog-to-digital converter converts the first and second electrical analog signals to digital signals. These digital signals are applied to a computer for determining the quantity .sqroot..rho.ck by computing the quantity ##EQU1## WHERE T.sub.i is the initial test specimen temperature and t is the elapsed time from the time that the specimens were first subjected to the heat source.


Find Patent Forward Citations

Fletcher, James. (1977). Apparatus for determining thermophysical properties of test specimens (U.S. Patent No. 4027524). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4027524

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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