The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 1977

Filed:

Feb. 04, 1976
Applicant:
Inventor:

Gilles Jean Bottard, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
2351 / ; 2351 / ;
Abstract

The disclosure describes improved apparatus for setting the states of storage elements in a data-processing system and for responding to the data read out of the storage elements. The apparatus includes a first error detector which enables an initial setting circuit to initially set a first storage element to a predetermined condition in response to an error. The initial setting circuit also disconnects the outputs of a second storage element while that element is receiving reference data and reconnects the outputs of the second storage element after the data has been written into that element. A second error detector monitors the outputs of the first and second storage elements as test signals are conducted to the storage elements.


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Bottard, Gilles. (1977). Testing system for a data processing unit (U.S. Patent No. 4025767). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4025767

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