The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 1977
Filed:
Apr. 12, 1976
Bela Julesz, Warren, NJ (US);
Becky Thomas Kerns, Summit, NJ (US);
Milton Everett Terry, Mountainside, NJ (US);
Bell Telephone Laboratories, Incorporated, Murray Hill, NJ (US);
Abstract
Random dot stereograms are used as stereopsis test targets to align stereomicroscopes in a technique for inspecting three-dimensonal objects. The random dot stereograms are computed and mounted on a holder such that they simulate inspection conditions of the three-dimensional object being inspected. The appearance of a pattern in depth on the random dot stereograms is an objective test as to whether the microscope has been adjusted properly by the inspector. In addition, random dot stereograms can also be used to (1) screen inspectors for stereodeficiencies, (2) facilitate the training of inspectors, and (3) monitor inspection rate control and fatigue of inspectors during inspection.