The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 1977

Filed:

Apr. 12, 1976
Applicant:
Inventors:

Claude Wartelle, Gouvieux, FR;

Michel Leveque, Champigny-sur-Marne, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
73105 ; 73 375 ;
Abstract

A method for measuring the surface roughness of a workpiece, comprising filling two capacitors with a compressed gas at specific pressures; applying to the rough surface of the workpiece to be studied the open end of a bell-form sensor connected to a second one of the capacitors; evacuating simultaneously and individually to atmosphere the two capacitors, the first through a calibrated throttle, the second through the leak existing between the edge of said sensor bell and the rough surface of the workpiece; measuring, during evacuation, the difference between the pressures in the two capacitors; and deducing from this pressure differential, by standardization with sample pieces of known roughness, the roughness of the piece studied.


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