The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1977
Filed:
Aug. 02, 1976
Applicant:
Inventor:
Friedrich Wenz, Seeheim, DT;
Assignee:
Gebr. Hofmann KG, Darmstadt, DT;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73146 ; 73462 ; 2351513 ;
Abstract
A method and apparatus for testing the uniformity of a rotary body whereby an electrical analysis signal is produced by travel measuring or force measuring transducers having an amplitude which varies as a function of the non-uniformities, multiplied by a direct current signal which varies as a function of the speed of rotation of the body to produce a further signal which is then integrated to provide the Fourier coefficients of the Fourier development series of the analysis signal.
Wenz, Friedrich. (1977). Method and apparatus for testing the uniformity of a rotary body (U.S. Patent No. 4018087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4018087
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile