The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 1977

Filed:

Aug. 26, 1975
Applicant:
Inventors:

Haruo Kotani, Osaka, JA;

Haruyoshi Hirata, Kyoto, JA;

Yoshinori Hosokawa, Kyoto, JA;

Assignee:

Horiba, Ltd., Kyoto, JA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250272 ; 250273 ;
Abstract

A non-dispersive fluorescence x-ray analyzer apparatus and method for measuring the concentration of an element contained in a sample. The apparatus has an x-ray source which directs x-rays against a sample to be analyzed and a reference sample which are both at equal distances from the x-ray source. The fluorescence x-ray spectrum from both the sample to be analyzed and the reference sample is detected and converted into a series of pulse signals. Counters count the signals from both samples, and the counter for counting the pulse signals from the reference sample is set to terminate the operation of the counter for counting the signals from the sample when a pre-determined number of pulses is counted from the reference sample. The number of pulses from the sample to be analyzed is then used for performing a mathematical computation to determine the concentration of the element in the sample being analyzed, which concentration is proportional to the number of pulses counted.


Find Patent Forward Citations

Loading…