The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1977
Filed:
Feb. 12, 1976
Donald L Horrocks, Placentia, CA (US);
Paul R Klein, Laguna Niguel, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A method for determining the source strength of a radioactive sample such as iodine-125 or cobalt-60, which emit pairs of quanta of radiation in coincidence, or near coincidence, and for determining the counting efficiency of a detection instrument analyzing such samples. A first counting channel is used to count events attributable to single quanta, a second counting channel is used to count events attributable to coincident pairs of quanta, and the sample source strength is computed from the results of measurement in these two counting channels. Then, the counting efficiency in a third channel designed for subsequent use in analyzing test samples may be determined from the counting of events in the third channel.