The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 1977
Filed:
Apr. 03, 1975
Applicant:
Inventors:
William Stanley Moore, Nottingham, EN;
Waldo Stephen Hinshaw, Pittsburgh, PA (US);
Assignee:
National Research Development Corporation, London, EN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ;
Abstract
A method of analyzing and apparatus for analyzing materials comprising subjecting a sample of the material to a non-homogeneous magnetic field having a predetermined time-dependency with respect to the sample such that a localized volume of the sample is subjected to a field the time dependent variation of which is unique with respect to the remainder of the sample. The sample is irradiated with radio-frequency energy to cause gyromagnetic resonance in the sample, and electrical energy produced by gyromagnetic resonance in the localized volume is measured.