The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 1977
Filed:
Apr. 29, 1974
John C Bouton, Doylestown, PA (US);
Melvin E Partin, Newtown Square, PA (US);
Robert C Hilghman, Willingboro, NJ (US);
Geometric Data Corporation, Wayne, PA (US);
Abstract
An automatic focusing system is provided for a microscopic instrument having a lens assembly and a platform for supporting an object. The system includes a flying spot scanner, the light from which is directed through the lens assembly at the object. The system includes means responsive to the light directed at the object for generating a signal representative of the color density of the object. The system includes electronic circuitry responsive to the signals and connected to the microscopic instrument for changing the focus of the instrument. The electronic means which are responsive to the signal change the focus of the instrument a plurality of times and includes decision means responsive to the signal for determining the optimum focus and moving the instrument to the optimum focus. The circuitry includes quantization means responsive to the signal which effectively determines the focus position which provides the sharpest resolution of the object examined by the microscopic instrument.