The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 1977
Filed:
Dec. 19, 1973
Setsuya Fujita, Kyoto, JA;
Ichiro Sawamura, Hachioji, JA;
Olympus Optical Co., Ltd., Tokyo, JA;
Abstract
A two wave length, scanning and integration type method of microspectrophotometrically measuring the light absorbancy of a specimen dyed with a coloring matter comprising scanning the specimen by light spots having two different wave lengths and integrating electric signals converted from the light spots traversing the specimen. The two different wave lengths .lambda..sub.1 and .lambda..sub.2 are selected such that at the wave length .lambda..sub.1 the light absorbancy of the absorption spectrum of the coloring matter is maximum and that at the wave length .lambda..sub.2 the light absorbancy is zero and the wave length .lambda..sub.2 is deviated from the absorption spectrum and located near the wave length .lambda..sub.1. A true light absorbancy in proportion to the amount of light absorbing substance at that part of the specimen which is to be measured is obtained by subtracting the light absorbancy produced by the light loss not peculiar to the specimen and caused by the light diffusion due to light reflection, refraction and diffraction in the specimen from the light absorbancy peculiar to the specimen. A two wave length, scanning and integration type microspectrophotometer for automatically carrying out the method of measurement is also disclosed.