The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1977
Filed:
Oct. 20, 1975
Applicant:
Inventors:
Kuniomi Abe, Kobe, JA;
Yuji Maekawa, Nishinomiya, JA;
Assignee:
Konan Camera Research Institute, Nishinomiya, JA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350 35 ; 350139 ;
Abstract
A binomial microscope having two parallel optical systems each including an objective lens, an erect prism and an ocular lens and wherein means are provided for moving each objective in a direction parallel to its optical axis to position the observed image in the vicinity of the object being observed.