The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 1977

Filed:

Dec. 08, 1975
Applicant:
Inventors:

David H Yen, Sunnyvale, CA (US);

Tim R Connely, Campbell, CA (US);

John J Lee, Cupertino, CA (US);

Assignee:

Filac Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
7336 / ;
Abstract

Electronic thermometer and method for determining temperature in which compensation is provided for the localized cooling of a body caused by bringing a sensing element of lower temperature into contact with the body. The output of the sensing element is combined with a signal representative of the initial temperature of the element to compensate for the localized cooling and provide an advance indication of the equilibrium temperature of the body.


Find Patent Forward Citations

Yen, David. (1977). Electronic thermometer and method (U.S. Patent No. 4008617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4008617

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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