The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1977
Filed:
Jul. 15, 1975
Applicant:
Inventors:
Walter Janach, Morges, CH;
Peter Kipfer, Jegenstorf, CH;
Assignee:
Haenni & Cie Aktiengesellschaft, Bern, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ; G01G / ;
U.S. Cl.
CPC ...
177209 ; 177225 ;
Abstract
A force measuring device comprises at least one gauge element which, at least, in some regions, is conceived as a spring element, the deformation of which changes the volume of liquid contained in a chamber delimited by the gauge element; the spring elements are equal to each other in every respect and so positioned that the spring characteristic is the same for all of them that the deformation remains in the linear domain of the spring characteristic and that the local change of volume of the chamber is proportional to the deformation of the respective spring element.