The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 1977

Filed:

Jan. 13, 1975
Applicant:
Inventors:

Ivan A Greenwood, Stamford, CT (US);

Donald S Bayley, Bedford, NY (US);

Assignee:

The Singer Company, Little Falls, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 40 ;
Abstract

A method and apparatus for making measurements of an electrically conductive material, which measurements can be used to determine the separate parameters thickness and conductivity without knowledge of the value of either of these parameters and in a manner giving improved freedom from sheet flutter, in which a transmitter coil is placed on one side of the sheet of material to be measured and a receiver coil on the other side at fixed distance from the transmitter coil and the transmitter coil is operated at two separate frequencies to obtain two relative phase relationships between the current in the transmitter coil and the electromotive force in the receiver coil such that the resulting phases differ in their functional relationships to thickness and conductivity, the frequency and phase being measured to obtain values which then can be used in independent equations to solve for at least one of thickness and conductivity.


Find Patent Forward Citations

Greenwood, Ivan. (1977). Method and apparatus for measuring parameters of a conductive material (U.S. Patent No. 4006405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4006405

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…