The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 1977
Filed:
Dec. 11, 1974
Applicant:
Inventor:
David A Grafton, Santa Monica, CA (US);
Assignee:
Xerox Corporation, Stamford, CT (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358293 ; 358208 ;
Abstract
A scanning system is provided which uses directed light from a scanning element, which directed light is reflected from a curved reflective surface for scanning across a medium with a planar object surface. The scanning element includes a planar reflective facet, such as the planar mirrored surface of a galvanometer, which scans the light across the curved reflective surface in a direction normal to its axis of curvature. To provide a linear focal line, the planar surface is tilted from its optical axis by a first angle and is off-set for rotation about an axis at a second angle from an optical axis orthogonal to the optical axis of the curved surface.