The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 1977
Filed:
May. 14, 1975
Applicant:
Inventors:
Mark Edwin Faulhaber, Wilmington, DE (US);
Edmund Haislett Smith, Jr, Wilmington, DE (US);
Assignee:
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
2351513 ; 356239 ;
Abstract
Method and apparatus for defect identification with normalizing of the optical-electrical inspection system gain function of scans across a full width of running product web in order to facilitate defect amplitude discrimination within the uneven portions of repetitive scan signals, and then, after accumulating a preselected number of gain-normalized scans, identifying protracted duration defect-related signals by amplitude discrimination.