The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 1977
Filed:
Sep. 17, 1975
Applicant:
Inventor:
Noboru Hayakawa, Tokyo, JA;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 3 / ;
Abstract
Disclosed are a method and apparatus for measuring the density of a suspeon wherein the suspension to be measured is first subjected to pressurization or depressurization in a closed container by means of a compressor or a vacuum pump to extinguish air bubbles and gas bubbles which would otherwise cause measurement error, and the measurement of the density of the suspension is then achieved with high exactitude in a bubble free state.
Hayakawa, Noboru. (1977). Method and apparatus for measuring density of suspension (U.S. Patent No. 4002053). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4002053
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile