The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 1977

Filed:

Jun. 30, 1975
Applicant:
Inventors:

Gerald George Barrett, San Jose, CA (US);

Louis Michael Hornung, Austin, TX (US);

Calvin Coolidge Jones, Jr, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 3401 / ; 3401 / ;
Abstract

A method of both testing all loops of a long serial magnetic bubble domain chip, and repairing the chip for automatic bypass of defective loops. Each repair station associated with each loop is sequentially loaded with a bubble domain. Then new domains are sequentially generated and positioned adjacent each loop. The domains initially loaded into the repair stations are shifted out in parallel for propagation along the loops. The new domains are then loaded in parallel into the repair stations. The domains propagated along the loops are read to determine defective loops, and form a basis for generating a repair pattern. The repair pattern is then loaded in parallel into the repair stations for sealing off defective loops.


Find Patent Forward Citations

Barrett, Gerald. (1977). Method of testing and repairing magnetic bubble domain chip (U.S. Patent No. 4001673). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4001673

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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