The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1976
Filed:
Jul. 01, 1975
Jun Kubota, Hitachi, J;
Soji Sasaki, Hitachi, J;
Hitachi, Ltd., , J;
Abstract
A supersonic or ultrasonic wave flaw detector in which acoustic boundaries of flaws and/or abnormality of materials within an object to be inspected is detected by supersonic or ultrasonic waves and the position and shape of such a flaw and/or abnormality are displayed. A hard object to be inspected is sector-scanned with a supersonic wave beam with a variable-angle beam probe in direct contact with the object. In a range of comparatively small incident angles at which the longitudinal wave mainly penetrates the object, sectional images due to echo signals of the longitudinal wave are displayed on a display screen with scanning lines representative of the transmission speed and direction of the longitudinal wave. In the range of large incident angles where the shear wave penetrates the object, on the other hand, sectional images due to the echo signals of the shear wave are displayed on the display screen with scanning lines representative of the transmission speed and direction of the shear wave. For this, the sweeping speed and direction for the display scanning lines are switched in accordance with the ranges of incident angles. The switched flaw detecting operation modes of longitudinal and shear waves thus combined covers a complete sectional image to be displayed on the display screen.