The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1976
Filed:
Jul. 22, 1975
Applicant:
Inventors:
Hiroshi Yamamoto, Kyoto, JA;
Takashi Kurita, Kyoto, JA;
Jugoro Suzuki, Kyoto, JA;
Rikuo Hira, Kyoto, JA;
Hideki Makabe, Kyoto, JA;
Assignee:
Shimadzu Seisakusho Ltd., Kyoto, JA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356 73 ; 356203 ; 356209 ;
Abstract
Densitometer for quantitative determination of the content of a sample spot on a TLC plate or the like, wherein dualwavelength zigzag scanning is conducted on the spot. Light reflected and transmitted by the sample is received by photometers, and compensation based on Kubelka-Munk's theoretical equations is made on the photometer output so that the output is substantially proportional to the quantity of the substance in the spot being scanned.