The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1976
Filed:
Jun. 23, 1975
Applicant:
Inventors:
Luitpold Schulz, Widnau, CH;
Andreas Schaefer, Balgach, CH;
Assignee:
Wild Heerbrugg Aktiengesellschaft, Heerbrugg, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350 36 ; 350247 ;
Abstract
The main objective of the microscope is shifted from the stereoscopic viewing position to a position in which its optic axis coincides with the optic axis of one of the twin variable magnification optical systems used for stereoscopic viewing. This shifted position provides better resolution for photography and measurement and reduces the correction requirements on the main objective. The shift of the objective is coordinated with a shift of the object under observation or a countershift of the upper part of the microscope in order to maintain the same field of view of the object.