The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1976
Filed:
Apr. 08, 1975
Eiichi Nakaoka, Kyoto, JA;
Takeharu Maekawa, Kyoto, JA;
Masahide Tokunaga, Kyoto, JA;
Shozo Morishima, Kyoto, JA;
Shimadzu Seisakusho Ltd., Kyoto, JA;
Abstract
Apparatus for automatically detecting and eliminating flaws on slabs or billets which comprises a single flaw detector for successively scanning the surfaces of objects to be examined to produce detection signals corresponding to the flaws detected on the objects; a plurality of storage units each of which separately stores the detection signals obtained from scanning of one of said objects; and a plurality of flaw eliminators to each of which one of said objects that have been scanned by said detector is transferred so that each of said eliminators scans the surface of said transferred object to eliminate the flaws thereon in accordance with the detection signals stored in the corresponding one of said storage units.