The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1976

Filed:

Apr. 29, 1975
Applicant:
Inventors:

Robert E Flannery, Alexandria, VA (US);

Paul LoVecchio, Reston, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01H / ;
U.S. Cl.
CPC ...
250273 ; 250275 ; 2502 / ;
Abstract

A method of x-ray topography of crystals at cryogenic temperatures which s not require continuous pumping of the sample chamber during low-temperature operation. The method eliminates the problems of vibrations degrading the high-resolution photographic image recorded and also prevents loss of the sample's angular alignment with the x-ray beam caused by torques produced by a vacuum-coupling mechanism.


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