The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1976
Filed:
May. 21, 1974
Gilles Jean Bottard, Paris, FR;
Marcel Rene Rottier, Rosny, Bois, FR;
Compagnie Honeywell Bull (Societe Anonyme), Paris, FR;
Abstract
The disclosure described improved apparatus for testing a data processing system including first and second functional members. First and second microprograms for testing the first and second functional members, respectively, are held in a read only store. If an error is detected in the first functional member while the data processing system is processing data, a circuit transmits the starting address of the first microprogram to an address register for the store, so that the first microprogram tests the defective first functional member. As the first functional member is tested, the symptoms needed to diagnose the defect are collected. If the first microprogram is completed without all of the symptoms required for diagnosis being collected, another circuit transmits the first address to the address register so that the first microprogram is executed again. The first microprogram continues to be executed until all of the symptoms needed for diagnosis are collected. The same procedure is used for the testing of the second functional member.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile