The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 1976
Filed:
Dec. 02, 1974
Applicant:
Inventors:
Takeo Seki, Kokubunji, JA;
Itsuji Maeda, Akishima, JA;
Assignees:
Hitachi Electronics, Ltd., BOTH OF, JA;
Nisshin Steel Co., BOTH OF, JA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356 73 ; 250563 ; 356200 ; 356209 ; 356210 ; 356237 ;
Abstract
A method and apparatus for detecting a flaw, color shading, or the like on the surface of a running object and for producing an electrical signal in response thereto by optically scanning such surface, characterized in that there is provided not only a photoelectric element for receiving the component of light regularly reflected from the surface of the running object, but also means for receiving the component of light irregularly reflected from the surface thereof, thereby to detect all of the defects that may exist on the surface of such object regardless of the surface finish.