The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 1976

Filed:

Mar. 18, 1975
Applicant:
Inventors:

Jerome R Cox, Jr, St. Louis, MO (US);

Donald L Snyder, Clayton, MO (US);

Assignee:

Picker Corporation, Cleveland, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
2504 / ; 250449 ; 250362 ; 2503 / ; 250490 ;
Abstract

An improved method and apparatus for transaxial tomographic scanning a patient. A scanning system is provided having a rotatably mounted X-ray radiation source/detector assembly which orbits and scans the patient in a plane of orbit. The source provides a plurality of beams of radiation having axes in the orbital plane. The beams pass through the patient to an array of detectors each of which is and respectively aligned with a different one of the beams. Radiation intensity data is collected at predetermined orientation of each beam - detector pair as the assembly orbits about the patient. In one embodiment the source and detector are rotated as a unit through a rotation angle .phi. about center of rotation while the assembly orbits the patient through an orbit angle .gamma.. Measurements are taken as the beams from the X-ray source sweep, due to the source detector rotation relative to a patient, through substantially uniformly spaced, coplanar points [t, (k), .theta.(n)] defined from an origin lying in the plane of orbit. Exact reconstruction is achieved when measurements are taken at the angles .phi., .gamma. characterized substantially as


Find Patent Forward Citations

Loading…