The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 1976

Filed:

Jun. 10, 1974
Applicant:
Inventors:

Ronald J Martone, Cheshire, CT (US);

Michael Yarsawich, East Haven, CT (US);

Walter Wolczek, Trumbull, CT (US);

Assignee:

Picker Corporation, Cleveland, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
2503 / ; 250369 ;
Abstract

A system and method for governing the exposure of an image generated by a radiation camera to an image sensing camera is disclosed. The exposure is terminated in response to the accumulation of a predetermined quantity of radiation, defining a radiation density, occurring in a predetermined area. An index is produced which represents the value of that quantity of radiation whose accumulation causes the exposure termination. The value of the predetermined radiation quantity represented by the index is sensed so that the radiation camera image intensity can be calibrated to compensate for changes in exposure amounts due to desired variations in radiation density of the exposure, to maintain the detectability of the image by the image sensing camera notwithstanding such variations. Provision is also made for calibrating the image intensity in accordance with the sensitivity of the image sensing camera, and for locating the index for maintaining its detectability and causing the proper centering of the radiation camera image.


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