The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1976
Filed:
Sep. 09, 1974
Applicant:
Inventor:
Erik W Anthon, Santa Rosa, CA (US);
Assignee:
Optical Coating Laboratory, Inc., Santa Rosa, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
3501 / ; 356 71 ; 356239 ;
Abstract
Fourier transform imaging microscope for examining parts carrying repetitive stripe pattern having a source of light with means forming a slit through which the light passes. Means including the part carrying the repetitive stripe pattern is used for forming a Fourier transform image of the slit after the light beam passes through it. Slit means is provided for suppressing the image of the stripe pattern itself while enhancing any defects and non-uniformities in the pattern.