The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 1976
Filed:
Mar. 31, 1975
Stanley R Sternberg, Ypsilanti, MI (US);
James E Young, Detroit, MI (US);
John W Lennington, Ypsilanti, MI (US);
Other;
Abstract
A dual path analyzer and a single path analyzer are disclosed, each for determining the concentration of one or more gaseous components in a mixture of gases. The preferred analyzer is a single path instrument which includes a source of infrared energy, a detector for the energy, a sample cell for the gas mixture positioned between the source and detector, and a filter wheel having a plurality of filters and a source blocking device positioned between the sample cell and detector for sequentially interposing the filters and the source blocking device between the source and the detector. Means are provided for amplifying the output signal of the detector and for processing the signal to provide a direct readout display which indicates the concentration of the gaseous components being analyzed. The processing electronics preferably include provision for calibrating the analyzer with clean ambient air, for compensating for background levels of radiation, and for correcting the displayed output signal for the effects of absorption band interferences between two or more gases in the gas mixture. The structure of the dual path analyzer includes a source of infrared energy, a detector for the energy, a sample cell for the gas mixture, a cell for a reference gas, and optical path means between the source and detector for sequentially directing the source energy through the sample cell, the reference cell, and through neither cell. Processing electronics similar to the single path instrument can be incorporated to compensate for background radiation and absorption band interferences.