The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 1976
Filed:
May. 05, 1975
James C Fletcher, , US;
Alain L Fymat, Pasadena, CA (US);
Other;
Abstract
A high-resolution Fourier interferometer-spectrophotopolarimeter is provided using (i) a single linear polarizer-analyzer the transmission axis azimuth of which is positioned successively in the three orientations of 0.degree., 45.degree., and 90.degree., in front of a detector; (ii) four flat mirrors, three of which are switchable to either of two positions to direct an incoming beam from an interferometer to the polarizer-analyzer (1) around a sample cell (2) transmitted through a medium in a cell and (3) reflected by medium in the cell; and (iii) four fixed focussing lenses, all located in a sample chamber attached at the exit side of the interferometer. This arrangement can provide the distribution of energy and complete polarization state across the spectrum of (a) the reference light entering from the interferometer; (b) the same light after a fixed-angle reflection from the sample cell containing a medium to be analyzed; and (c) the same light after direct transmission through the same sample cell, with the spectral resolution provided by the interferometer.