The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1976

Filed:

Oct. 29, 1974
Applicant:
Inventor:

Bill Hunt, Everett, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ;
Abstract

An apparatus for testing the junctions of a semiconductor while the semiconductor is in an electrical circuit. The apparatus includes a step-down transformer which operates preferably from a 120 volt AC source. A low voltage secondary winding preferably includes a common lead, a 6.5 volt lead, and a secondary tap lead between the common lead and the 6.5 volt lead. The 6.5 volt lead is connected through a low value resistance to ground. The test leads of the apparatus are connected to the secondary winding of the transformer in such a manner that a low circuit output impedance is maintained at the test leads. Connections to the horizontal and vertical inputs of a conventional oscilloscope or similar apparatus are provided through a voltage divider to the common lead and the tap lead, respectively. In operation, the pattern generated on the face of the oscilloscope in indicative of the condition of the junction of the semiconductor.


Find Patent Forward Citations

Loading…