The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1976

Filed:

Feb. 27, 1975
Applicant:
Inventor:

Henricus Mathias Kessels, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250272 ; 2502 / ;
Abstract

A specimen holder comprising a specimen space to be conditioned for an X-ray diffraction apparatus which is provided with a radiation window which is made of beryllium and which closes an opening in the holder over an arc of 180.degree. in a vacuumtight manner. To this end, the window is annealed to a temperature of approximately 600.degree.C. The specimen is provided on a removable support table, a support face of which contains the axis of curvature of the window.


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