The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1976

Filed:

Dec. 11, 1974
Applicant:
Inventors:

Hans Joachim Klein, Wuppertal, DT;

Manfred Rupprecht, Leverkusen, DT;

Heinz Wonneberg, Leverkusen, DT;

Julius Geiger, Odenthal-Gloebusch, DT;

Assignee:

AGFA-Gevaert, A.G., Leverkusen, DT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356200 ; 250563 ; 250572 ; 356237 ;
Abstract

In a process for detecting longitudinally orientated faults on moving webs of paper or film, the web is optically scanned line by line transversely to its direction of movement and read by reflection. The scanning line is moved to and fro across the whole web at constant velocity and during a given number of scanning movements the instantaneous value of the reflected signal is interrogated at two fixed time marks within the scanning line and stored and the average values over a scanning cycle are formed separately for each of the two time marks. The average values ae indicated and recorded as faults only if a value different from the average noise value is obtained from both time marks in succession.


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