The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 1976
Filed:
Feb. 14, 1974
Applicant:
Inventors:
Michael J Mendrin, Montebello, CA (US);
Richard H Taylor, Los Angeles, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3561 / ;
Abstract
Distance measurement by conventional optical interferometry requires physical movement of an optical element. The present system obtains interference with a continuous range of radiation wavelengths, providing a direct measurement of a constant optical path difference, in terms of the fringe count and the end wavelengths of the range employed. Variations in the optical path difference occurring during the measurement are compensated by simultaneous interferometry with a fixed wavelength.