The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 1976

Filed:

Aug. 11, 1975
Applicant:
Inventor:

David D Sharrit, Santa Rosa, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ;
Abstract

A network analyzer which compares a reference signal supplied to a device under test with an output signal from the device under test is used to measure the group delay caused by the device under test. The reference signal is produced by a swept frequency signal generator. During the sweep of the signal generator the difference between the instantaneous frequencies of the reference signal and the output signal from the device under test is determined as is the rate of change of the frequency of the reference signal. The instantaneous frequency difference is divided by the rate of change of the reference frequency to produce an instantaneous indication of the group delay produced by the device under test.


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Sharrit, David. (1976). Group delay measurement apparatus and method (U.S. Patent No. 3968427). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/3968427

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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