The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 1976

Filed:

Mar. 22, 1974
Applicant:
Inventors:

Donald D Schmidt, Midland, MI (US);

Gary L Jewett, Midland, MI (US);

Richard G Melcher, Midland, MI (US);

Ritchie A Wessling, Midland, MI (US);

Assignee:

The Dow Chemical Company, Midland, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2323 / ; 73 23 ; 250362 ;
Abstract

Method for quantitatively analyzing substances containing elements other than carbon, hydrogen and oxygen by (1) adsorbing such substances on a particulate, substantially dust and contaminant free carbonized product prepared by (A) first partially dehydrochlorinating a normally crystalline vinylidene chloride polymer at temperatures below the melting point of such polymer to an extent of at least about 5 percent of theoretical HCl loss, then (B) completing the dehydrochlorination of such material, in the substantial absence of oxygen, by heating the material to carbonizing temperatures of from about 600.degree.C to about 1200.degree.C; then (2) analyzing the substance adsorbed on such carbonized product.


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