The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1976
Filed:
Apr. 21, 1975
Richard Arthur Hanson, Concord, CA (US);
Systron Donner Corporation, Concord, CA (US);
Abstract
An apparatus for measuring small angular displacement of any object having an attached light reflective surface. A reflecting mirror is attached to the test object for receiving a light beam from a light source and for reflecting the beam toward an angular excursion amplifier. A beam position detector is included in the angular excursion amplifier together with adjustable means for directing the beam toward the beam position sensor. A second beam is directed toward the angular excursion amplifier for impingement upon a reflector mounted upon the adjustable means in the angular excursion amplifier. The reflected second beam is directed toward a scale having a linear gradient calibrated in terms of angular excursion of the test object. In this fashion minute excursion angles of the test object are presented at the scale as amplified linear sweeps of the reflected second beam. One embodiment visualizes manual adjustment of the adjustable means in the angular excursion amplifier while another embodiment visualizes servoed adjustable means in the angular excursion amplifier. Means are provided for aligning the light beams with the angular excursion amplifier and the scale. The angular excursion amplifier is positioned at a relatively short predetermined distance from the test object.