The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 1976

Filed:

Mar. 06, 1975
Applicant:
Inventors:

Paul R Bauer, Palo Alto, CA (US);

Duane E Dunwoodie, Los Altos, CA (US);

Assignee:

Wiltron Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324 / ; 324115 ; 3241 / ;
Abstract

Centralized telephone circuit testing equipment with receptacles for selectively receiving a wide variety of electronic circuit modules, various modules being provided to make the equipment capable of performing a large number of commonly employed telephone tests. A scanning system is disclosed as part of the central measuring equipment for determining which of a plurality of remote testing stations has requested access to the central measuring equipment, one requesting remote station at a time being given complete control over a test function of the central measuring equipment for conducting tests on a telephone trunk. Improvements are also disclosed in the individual test function electronic circuit modules, including common circuits for use in measuring both signal level and circuit noise, a logarithmic analog-to-digital convertor capable of handling signals that cross zero dBm in level, round off digital display circuits to improve accuracy of the display and to aid in calibrating the instruments, and an improved frequency measuring circuit.


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