The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1976
Filed:
Jun. 05, 1975
Satoshi Nakatani, Nishinomiya, JA;
Yoichi Ito, Amagasaki, JA;
Abstract
A device for detecting a strain and foreign matters in a glass container is designed to amplify the electrical output obtained by bringing vertical scanning lines into intersection with the image of horizontally rotating strain polarized light. A polarizer and an analyzer are disposed in such a manner that their optical axes cross each other at right angles, and polarized light from the polarizer is projected upon a rotating glass container under inspection and is allowed to pass through the analyzer only when strain and/or foreign matter is found in the glass container. The resulting strain polarized light is projected upon a non-storage camera tube through a lens so as to vertically scan with a line through the center of an image of the glass container on the photoelectric surface of the tube at a speed proportional to the moving speed of the glass container to thereby bring the vertical scanning lines into intersection with the image of the horizontally rotating strain polarized light.