The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 1976

Filed:

Jan. 10, 1975
Applicant:
Inventors:

John P Lindley, Redwood City, CA (US);

James Rieden, San Jose, CA (US);

Assignee:

Itek Corporation, Lexington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ; G01J / ;
U.S. Cl.
CPC ...
250208 ; 250216 ; 250226 ; 250578 ; 356 74 ; 356 93 ;
Abstract

An electro-optic system having an extended dynamic power range. The dynamic power range of a Bragg cell spectrum analyzer is expanded by unevenly splitting the radiation output of the Bragg cell with a beam splitter and directing a major portion of the radiation output to a first photodiode array and a minor portion of the radiation output to a second photodiode array. The first photodiode array is utilized to detect the output of the Bragg cell until it becomes sufficiently intense to saturate it. When the first photodiode array becomes saturated, the second photodiode array, which receives a minor amount of radiation from the Bragg cell, is utilized to detect the output of the Bragg cell. Detection with the first and second photodiode arrays allows the dynamic power detection range of the system to be expanded to include the combined detection ranges of the first and second photodiode arrays.


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