The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1976
Filed:
Jun. 05, 1975
Joseph G Carleton, Palo Alto, CA (US);
Richard G Sweet, Palo Alto, CA (US);
The Board of Trustees of Leland Stanford Junior University, Stanford, CT (US);
Abstract
Particle analyzing method and apparatus are provided for measuring the intensity of light scattered from a particle as a function of angle. Particles such as biological cells are contained in a stream for travel along a path which includes a scatter line along which the particles pass successively. A beam of collimated monochromatic radiation is directed onto the flow path, and detector means are provided having a radiation acceptance geometry whose projection intercepts the beam along the scatter line. The projected acceptance geometry includes an aperture image located adjacent the scatter line and having a dimension in the direction of travel of the particles which is substantially less than the length of the scatter line such that the angle of scatter radiation detectable by the detector means varies according to the position of the particle along the scatter line. The output from the detector provides a measure of the scatter light intensity versus angle characteristic of the particle.