The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1976
Filed:
Jun. 18, 1974
Leslie S Wirt, Newhall, CA (US);
Duane L Morrow, Saugus, CA (US);
Lockheed Aircraft Corporation, Burbank, CA (US);
Abstract
Apparatus and method for measuring the impedance of oscillatory systems, or elements of such systems, which exhibit nonlinear behavior at high excitation amplitudes. Excitation of the element being tested, which element may be either acoustical, electrical, or mechanical, is in the form of a combination of a high-intensity biasing signal having a broadband spectrum, and a low-intensity pure sinusoidal tracer signal. The tracer signal is retrieved at an appropriate measuring point in the test system by means of highly-selective filtering. Although the broadband signal comprises the real or basic test signal input to the test element, the retrieved tracer signal is substituted therefor for the purpose of deriving the element's impedance through the use of conventional impedance algorithms. Algorithm solutions thus provided correspond to the response of the element to the entire spectrum of the broadband excitation.