The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 1976
Filed:
Jan. 31, 1975
Ken Yonekubo, Tama, JA;
Olympus Optical Co., Ltd., Tokyo, JA;
Abstract
Vertical reflection type fluorescence microphotometer in which a specimen under examination is irradiated with an ultraviolet ray directed onto the upper surface of the specimen and light reflected back from the specimen is measured by means of a photoelectric tube. The fluorescence microphotometer comprises a light source for emitting an exciting light, a lens for forming an image of the light source at a position where an aperture diaphragm is located, a relay lens for forming an image of the aperture diaphragm through a dichroic mirror in a focal point located at the image side of an objective lens, and a pinhole arranged between the relay lens and the dichroic mirror. The objective lens can form an image of the pinhole on the upper surface of the specimen as well as an image of the fluorescence emitting position of the specimen through the dichroic mirror at a position where a diaphragm is located. The fluorescence transmitted through the diaphragm is received by the photoelectric tube.