The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 1976
Filed:
Aug. 06, 1974
Frederick W Bull, 4990 Lubbeck i. Westf., CO (US);
Richard A Leavitt, Longmont, CO (US);
Robert L Weiss, Longmont, CO (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An improved magnetic tape test article includes a plurality of longitudinally spaced-apart test sections. Some of the test sections are repeated to facilitate recorder tests under different tape wrap conditions. One of the tests is a compound test enabling several simultaneous measurements of several parameters of the recorder. The tests are particularly adaptable for helical scan digital signal recorders. The tests measure parameters such as head to medium spacing, tracking (skew, servo offset and the like), readback circuit performance, including clocking, phase tolerances, error detection and correction operations, response to dropouts, resynchronization response and amplitude tolerances. Profile of the spacing between the record medium and the head is measured over the length of the recorded path around the cylindrical mandrel.