The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1976

Filed:

Dec. 20, 1973
Applicant:
Inventor:

David Grafton, Santa Monica, CA (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
178 / ; 178-76 ;
Abstract

A flux scanner which is comprised of a rotating polygon for scanning a beam of radiated flux transverse a photoreceptive medium. In the beam path between the flux source and the polygon, an astigmatic-beam expander lens is employed to focus the flux distributions to a spot at an image plane. The astigmatic lens is configured so as to produce a very narrow beam of flux to control the size of the spot in a direction orthogonal to the transverse direction, without any loss of efficiency. Between the photoreceptive medium and the polygon, a cylindrical lens and linear optical elements are positioned to focus the beam to control the size of the spot along the transverse direction. The transverse direction is designated optically as the tangential plane; whereas the direction orthogonal to the transverse direction is designated optically as the sagittal plane. These optical elements are configured to cause the sagittal and tangential planes of best focus to coincide at the image plane even though the object effectively emanates from two separate locations.


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