The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1976
Filed:
Aug. 13, 1973
Lev Petrovich Ulyanov, Moscow, SU;
Oleg Nikolaevich Borisenkov, Moscow, SU;
Natalya Nikolaevna Kastorskaya, Moscow, SU;
Georgy Vladimirovich Vinogradov, Moscow, SU;
Jury Grigorievich Yanovsky, Moscow, SU;
Sergei Ivanovich Sergeenkov, Moscow, SU;
Other;
Abstract
The method of measuring dynamic characteristics of materials consists in obtaining, in the course of measurement, a control current which ensures oscillations of a specimen of a material at a preset amplitude and frequency. Then, real and imaginary components of the control current are discriminated, and two restoring currents are generated; these currents are summated, and the total current is used to control the movement of the specimen; after that, the real and imaginary components of the control current are discriminated for the second time, and their value, as well as the values of the restoring currents and the preset amplitude and frequency of the deformation of the specimen are used to calculate dynamic characteristics of the material.