The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1976

Filed:

Nov. 23, 1970
Applicant:
Inventors:

Marko Afendykiw, Ann Arbor, MI (US);

John M Boyle, China Lake, CA (US);

Charles E Hendrix, Pacific Palisades, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ; G01S / ;
U.S. Cl.
CPC ...
343 / ; 343 / ; 3431 / ;
Abstract

A radar system for determining the position of a target using a radio frency source of opportunity. The system uses an interferometer antenna and cross-correlation techniques to measure the time delay in receiving a reflected signal from the target as compared to receiving a direct signal from the signal source. Thereby, the distance from the RF source via the target to the antenna is determined. Additionally, the system uses a plurality of interferometer antennas and cross-correlation techniques to measure the relative phase difference between the signals received by the antennas. Thereby the angle of arrival of the reflected signals from the target is determined. Combining the range and angular information locates the target.


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