The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 1976

Filed:

Oct. 07, 1974
Applicant:
Inventors:

Gunter Hempowitz, Julich, DT;

Jochen Pokar, Julich, DT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
250343 ; 356184 ;
Abstract

For measuring the proportion or quantity of a component in a radiation-transparent mixture, a beam is passed through the mixture and subsequently split by a beam splitter into a measuring beam and a reference beam. The measuring beam is passed through a narrow-band interference filter which has a transmitting wavelength that corresponds to a discrete absorption wavelength of the component. This filter is oscillated in a range of oscillation which traverses the absorption maximum. The reference beam is passed through a narrow-band interference filter which has a transmitting wavelength that differs from the absorption wavelength of the component. Subsequently, the radiation intensities of the measuring beam and the reference beam are separately detected and their difference is formed. This difference is a function of the proportion or quantity of the component.


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