The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1976
Filed:
Apr. 09, 1975
Applicant:
Inventors:
Shogo Shirai, Yokohama, JA;
Haruo Uchida, Machida, JA;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K / ;
U.S. Cl.
CPC ...
250441 ; 250442 ; 250311 ;
Abstract
An apparatus for releasably and adjustably mounting a specimen in an electron microscope. A specimen-holding unit is releasably and fluidtightly mounted in an evacuatable chamber and abutting the lens of the electron microscope in the mounted position. The unit is held in place by the pressure differential between the chamber and the atmosphere when the chamber is evacuated. The specimen-holding unit comprises a rotatable specimen-holding shaft disposed eccentrically within a rotatable support member. The specimen is variably positioned under the electron beam by the rotation of the member and the rotation of the shaft with respect to the member.